SEM specimen mounts for FIB applications, pin mount

The SEM specimen pin mounts with special low profile are available as flat, as a 90° mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made from aluminium with 3.2mm diameter pin stub. Compatible with FEI and TESCAN systems with the standard pin length and ZEISS/LEO systems with the short 6mm pin and with pin adapters in Hitachi and JEOL systems. 

Styles:

  • Flat mount with either 6mm or 8mm pin
  • 90 deg. with either 6mm or 8mm pin
  • 38 deg. for FEI Quanta and Helios Dualbeams
  • 36 deg. for ZEISS/LEO CrossBeam, NVISON, and AURIGA systems
  • 35 deg. for TESCAN LYRA and VELA FIBXSEM systems
Code Title Size Mount angle Pack Size Availability Price Updated: 29-01-2022
GF321 SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 8mm Flat Pack/10 2 in stock AU $57.00
GF321-SP SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 6mm Flat Pack/10 In Stock AU $47.00
GF322-SP SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 6mm 90 deg. Pack/10 2 weeks AU $55.00
GF322 SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 8mm 90 deg. Pack/10 2 weeks AU $60.00
GF323 SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 8mm 38 deg. Pack/10 2 weeks AU $75.00
GF324-SP SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 6mm 36 deg. Pack/10 2 weeks AU $75.00
GF325-SP SEM specimen mounts for FIB applications, pin mount 12.7mm dia. x 6mm 35 deg. Pack/10 2 weeks AU $75.00