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Ion sputter calibration standard, nickel/chromium
Nickel/chromium
Consisting of 12 alternating layers: 6 layers of Cr (~53nm) and 6 layers of Ni (~64nm) for a total thickness of ~700nm with a maximum variation across the 75mm production wafer of ±2%. Standard is on a 10 x 30mm section of a polished silicon wafer. The mass density of Cr and Ni was measured using electron beam excitation and measuring characteristic X-ray intensities.
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Code | Title | Pack Size | Availability | Price | Updated: 23-05-2022 |
---|---|---|---|---|---|
GF353 | Ion sputter calibration standard, nickel/chromium | Each | 2 weeks | AU $1,574.00 |