Silicon chip wafer, cut squares

Specimen support for SEM, SIMS, AFM.

They are useful as a smooth, inert background is for the determination of resolution and contrast of "in-the-lens" SEMs equipped with high brightness electron emitters. Additionally, conducting specimens, or non-conducting specimens in low vacuum or low voltage SEM, may be viewed without coating.
Si chips are opaque, have low electrical resistance, are very smooth, brittle and hard like glass. Si chips are chemically quite inert. These chips are pre-cleaned, but for tissue and cell culture, additional cleaning and sterilising may be required.
Si-chips are opaque, of low electrical resistance and have surface properties equal to glass (including smoothness). They are also good substrates...

Specimen support for SEM, SIMS, AFM.

They are useful as a smooth, inert background is for the determination of resolution and contrast of "in-the-lens" SEMs equipped with high brightness electron emitters. Additionally, conducting specimens, or non-conducting specimens in low vacuum or low voltage SEM, may be viewed without coating.
Si chips are opaque, have low electrical resistance, are very smooth, brittle and hard like glass. Si chips are chemically quite inert. These chips are pre-cleaned, but for tissue and cell culture, additional cleaning and sterilising may be required.
Si-chips are opaque, of low electrical resistance and have surface properties equal to glass (including smoothness). They are also good substrates for growing or mounting cells. Si-chips are precleaned before packaging. Also ideal for imaging small particles due to low background signal.

The wafers are cut into chips measuring 5 x 5mm, 5 x 7mm or 10 x 10mm.

Properties
Orientation <100>
Resistance 1-30 Ohms
Type P (Boron) if 1 primary flat
No SiO2 top coating
Wafer thickness is 460 - 530um
Wafer is polished on one side
Roughness: 2nm
Before dicing they are rinsed in de-ionized water for cleaning

Peters, K.R., Working at higher magnifications in scanning electron microscopy with secondary and backscattered electrons on metal coated biological specimens and imaging macromolecular cell membrane structures, 1985 Scanning Electron Microscopy, 1985, IV, 159.
Apkarian, R.P., High-resolution signal detection of specimen-specific secondary electrons in an analytical SEM, "Proc.. 44th Ann. Meeting of the EMSA", 1986, G.W. Bailey, Ed., San Francisco Press, 658.

Code Title Size Pack Size Availability Price
GA540-10 Silicon chip wafer, cut squares 10x10mm pack/55 Only 3 AU $171.00
GA540-05 Silicon chip wafer, cut squares 5x5mm pack/270 In Stock AU $171.00
GA540-07 Silicon chip wafer, cut squares 5x7mm pack/187 2 weeks AU $171.00
GA540-12-SPEC Silicon chip wafer, cut squares 12x12mm pack/40 (approx) 2 weeks AU $148.00
Code Title Size Pack Size Availability Price
GA540-10 Silicon chip wafer, cut squares 10x10mm pack/55 Only 3 AU $171.00
GA540-05 Silicon chip wafer, cut squares 5x5mm pack/270 In Stock AU $171.00
GA540-07 Silicon chip wafer, cut squares 5x7mm pack/187 2 weeks AU $171.00
GA540-12-SPEC Silicon chip wafer, cut squares 12x12mm pack/40 (approx) 2 weeks AU $148.00