The FIB sample prep and grid holder accommodates an FIB sample mounted on a standard 25mm pin stub for FIB milling and lift out procedures. It also holds FIB grids of the same thickness, to mount the prepared lamellae on an FIB grid for subsequent TEM imaging. Versatile holder suitable for all FIB/SEM systems which accept pin mount holders such as the FEI, Zeiss and TESCAN systems. For the JEOL and Hitachi systems a pin mount adapter is needed. Brass thumbscrews facilitate easy loading and unloading. Overall size is 50 x 29 x 13.5mm. Standard 3.2mm dia. pin. Material: vacuum grade aluminium with brass screws.