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Ultra high resolution Au-C on stub
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Please choose carefully. Returns of this item are subject to approval.
| Code | Title | Type | Pack Size | Availability | Price | Updated: 28-10-2021 |
|---|---|---|---|---|---|---|
| EMS79512-01 | Ultra high resolution Au-C on stub | 12.5mm pin | Each | 2 weeks | AU $692.00 | |
| EMS79512-02 | Ultra high resolution Au-C on stub | Joel | Each | 2 weeks | AU $692.00 | |
| EMS79512-03 | Ultra high resolution Au-C on stub | ISI | Each | 2 weeks | AU $692.00 | |
| EMS79512-04 | Ultra high resolution Au-C on stub | Hitachi | Each | 2 weeks | AU $692.00 | |
| EMS79512-05 | Ultra high resolution Au-C on stub | Carbon Planchet | Each | 2 weeks | AU $692.00 |
| Code | Title | Type | Pack Size | Availability | Price | |
|---|---|---|---|---|---|---|
| EMS79512-01 | Ultra high resolution Au-C on stub | 12.5mm pin | Each | 2 weeks | AU $692.00 | |
| EMS79512-02 | Ultra high resolution Au-C on stub | Joel | Each | 2 weeks | AU $692.00 | |
| EMS79512-03 | Ultra high resolution Au-C on stub | ISI | Each | 2 weeks | AU $692.00 | |
| EMS79512-04 | Ultra high resolution Au-C on stub | Hitachi | Each | 2 weeks | AU $692.00 | |
| EMS79512-05 | Ultra high resolution Au-C on stub | Carbon Planchet | Each | 2 weeks | AU $692.00 |
